zombiess
10 MW
mxlemming said:Why not a phase shunt/other current measurement and a comparator? That could be made to trip within 1-2us, which would almost certainly protect from phase dead short.
Shoot through (this is an area where me, Marcos and Zombies are in some contention) I think you can manage by having gate drives that enforce dead time and no high/low both on condition and by making sure your FETs are chosen to have low enough miller capacitance that the miller cannot turn the FET on. Beyond that, I think you have a dead board that's shorting something open anyway and all bets are off/your next line of protection is a proper case that stops conductive fluff from getting on your board.
A phase shunt + comparator could work, but I don't know how sensitive GaN devices are to overload. Si devices handle it quite well, but from what I've read and heard, GaN design takes more finess. Unfortunately, I don't have experience. Down side with phase shunts is power dissipation, but in a low power application they could work. Catch a shoot through event is a last chance safety net which hopefully never happens because everything else has been designed to prevent the scenario from occurring. However external events such as mechanical wear on phase wires causing a short happen unexpectedly. It's nice if the controller doesn't plasma ball until the fault can be cleared.
The suggestions Marcos and I make are usually to quicken others path to success in a deceivingly complicated field, I'm still learning new stuff on a regular basis and I've been at it since 2011. Design choices come down to the designers risk appetite, but often times designers don't understand the risks and therefore don't properly rank them.